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Advances in Signal Processing to Reduce Lift-off Noise in Eddy Current TestsMatteo Cacciola, A. Gasparics, Francesco Carlo Morabito, M. Versaci, and Vincenzo Barrile doi:10.2529/PIERS061007215011 Downloads: 972 Abstract:Nowadays, Non Destructive Testing and Evaluation (NDT/NDE) are frequently used to evaluate integrity of manufactured articles in civil or industrial applications. In this framework, Eddy Current Test (ECT) technique has a primary role for inspection of conducting materials. Solution of many related inverse problems requires an accurate comprehension of measured data: it is one of the most challenging problem in this context. That's why a suitable signal pre-processing is necessary. In this paper, advanced signal processing techniques are evaluated in order to reduce the impact of lift-off effect on the eddy current data. Some hybrid approaches are also depicted, with encouraging results.References:1. Chen, G., A. Yamaguchi, and K. Miya, "A novel signal processing technique for eddy-current testing of steam generator tubes," IEEE Trans. on Magnetics, Vol. 34, No. 3, 642-648, 1998. 2. Morabito, F. C., "Independent component analysis and feature extraction techniques for NDT/NDE data," Materials Evaluation, Vol. 58, No. 1, 85-92, 2000. 3. Fiori, S. and P. Burrascano, "ECT-data fusion by the independent component analysis for non-destructuve evaluation of metallic slabs," Third International Conference on Independent Component Analysis and Signal Separation, 323-327, San Diego, California, 2001. 4. Gasparics, A., C. S. Daroczi, G. Vertesy, and J. Pavo, "Improvement of ECT probes based on Fluxset-type magnetic field sensor," Electromagnetic Nondestructive Evaluation, No. 2, 146-151, 1998. 5. Gasparics, A., Probe 98/6 - Surface scan results within MANODET Project, available at http://alag3.mfa.kfki.hu/ect/manodet/results/FS06B/index.htm, October 13, 2006. 6. Daubechies, I., "Ten lectures on wavelets," CBMS-NSF Series in Applied Mathematics, 1992. 7. Hyvarinen, A. and E. Oja, "Independent component analysis: Algorithms and applications," Neural Networks, Vol. 13, No. 4-5, 411-430, 2000. 8. Hyvarinen, A., "Fast and robust fixed-point algorithms for independent component analysis," IEEE Trans. on Neural Networks, Vol. 10, No. 3, 626-634, 1999. |
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